The CIQTEK DB550 Focused Ion Beam Scanning Electron Microscope (FIB-SEM) has a focused ion beam column for nano-analysis and specimen preparation. It utilizes “super tunnel” electron optics technology, low aberration, and non-magnetic objective design, and has the “low voltage, high resolution” feature to ensure its nanoscale analytical capabilities.

 

The ion columns facilitate a Ga+ liquid metal ion source with highly stable and high-quality ion beams to ensure nanofabrication capabilities. The DB550 is an all-in-one nano-analysis and fabrication workstation with an integrated nano-manipulator, gas injection system, and user-friendly GUI software.

 

Check more features at https://www.ciqtekglobal.com/fib-sem-db550_p30.html

CIQTEK's high-precision instruments help scientists explore materials and physical properties at the microscopic level.

ClQTEK meets its customers' needs by providing customized products and complete application solutions in environmental science, biochemistry, chip semiconductors, and materials science. This enables customers to innovate and increase productivity.

The company's main business includes Scanning Electron Microscopes (SEMs), Electron Paramagnetic Resonance (Electron Spin Resonance) Spectroscopy, Scanning NV Probe Microscopes, and BET Surface Area and pore Analyzers.

CIQTEK has over 700 employees, including 40% of the R&D team. Twelve application centers provide customers with sample testing, experimental comparison, performance evaluation, application direction development, and advanced training on product operation.