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Electron Microscopes / STM / AFM
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Recommend Products
Focused Ion Beam FIB-SEM DB550
Automatic BET Surface Area & Porosim...
Ultra-high Res Field Emission SEM500...
Scanning NV Microscope (SNVM) - Nano...
X-band Benchtop Electron Paramagneti...
Tungsten Filament Scanning Electron ...
Gas Pycnometer Density Analyzer EASY...
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CIQTEK
CIQTEK Team
+86 551 62835225
info@ciqtek.com
https://www.ciqtekglobal.com/
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Gas Pycnometer Density Analyzer EASY-G 1310M
Model: EASY-G 1310M
origin of place: China
01/24/25
428
Get Quote
Tungsten Filament Scanning Electron Microscope SEM3200
Model: SEM3200
origin of place: China
01/24/25
1340
Get Quote
X-band Benchtop Electron Paramagnetic Resonance Spectrometer EPR200M
Model: EPR200M
origin of place: China
01/24/25
690
Get Quote
Scanning NV Microscope (SNVM) - Nanomagnetic Imaging Microscope
Model: Diamond III/IV
origin of place: China
01/24/25
1704
Get Quote
Ultra-high Res Field Emission SEM5000X
Model: SEM5000X
origin of place: China
01/24/25
1027
Get Quote
Automatic BET Surface Area & Porosimetry Analyzer EASY-V Series
Model: EASY-V Series
origin of place: China
01/24/25
306
Get Quote
Focused Ion Beam FIB-SEM DB550
Model: DB550
origin of place: China
01/24/25
239
Get Quote
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