AELAB X-ray Diffractometer AL-2700A / AL-2700B
Advanced XRD System for Precise Material Structure Analysis. The AL-2700 series offers comprehensive analysis of crystalline materials, suitable for metals, ceramics, composites, nanomaterials, and thin films. Featuring high-precision goniometer design, advanced detector options, and powerful software control, it delivers superior stability and accuracy across research and industrial applications.
Engineered for versatility, the AL-2700A and AL-2700B support powders, bulk samples, and micro-samples, ensuring dependable results in materials science, environmental testing, cement, pharmaceutical, and polymer industries.
Category Insight: X-ray diffractometers (XRD) are essential for phase identification, crystallinity analysis, and structural characterization in materials research and industrial quality control.
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Technical Features and Specifications
| Specification |
AL-2700A |
AL-2700B |
| Rated Power |
3 kW (High-frequency HV control) |
4 kW |
| Tube Voltage |
10–60 kV |
| Tube Current |
5–50 mA |
5–80 mA |
| X-ray Tube |
Metal-ceramic, Target: Cu/Fe/Co/Cr/Mo; Power: 2.4 kW |
| Focus Size |
1×10 mm, 0.4×14 mm, or 2×12 mm |
| Stability |
≤0.005% |
≤0.01% |
| Goniometer Structure |
Sample level (θ–θ) geometry |
| Radius of Diffraction |
225 mm (custom 150–285 mm) |
| 2θ Scanning Range |
0–160° |
| Scanning Speed |
0.0012°–50°/min |
| Angle Repeat Accuracy |
1/10000° |
| Detector Options |
Proportional Counter, Scintillation Counter, Silicon Drift Detector (SDD), 1D Semiconductor Array |
| Energy Resolution |
≤25% (PC), 550 eV (SC), 520 eV (SDD) |
| System Stability |
≤0.01% |
| Radiation Dose |
≤1 µSv/h (without protective device) |
| Instrument Stability |
≤0.1% |
≤0.5% |
| Dimensions (L×W×H) |
1000 × 800 × 1600 mm |
💡 Key Advantages
- Supports wide range of sample types – powders, thin films, and micro-samples
- High angular precision (±0.0001°) for superior crystal structure analysis
- Stable high-frequency power supply ensuring long-term measurement reliability
- Selectable detectors for flexibility between speed and resolution
- Meets international standards (SRM1976b angular linearity ≤0.022°)
- Compact 1.6 m frame ideal for laboratory and industrial integration
Applications: Crystallographic analysis of metals, alloys, polymers, semiconductors, pharmaceuticals, cement, clays, and nanomaterials. Widely used in materials science, chemical industry, environmental monitoring, and academic research.
FAQ
Q: What is the difference between AL-2700A and AL-2700B?
A: The AL-2700B offers higher rated power (4 kW) and extended tube current range (up to 80 mA) for more demanding analytical applications.
Q: What detectors are available?
A: Multiple detector options are supported, including Proportional Counter, Scintillation Counter, and Silicon Drift Detector (SDD) for flexible resolution and speed.
Q: Can the goniometer radius be customized?
A: Yes, users can request custom diffraction radii between 150–285 mm to suit specific sample types or resolution requirements.
Learn more: Visit AELAB X-ray Diffractometer AL-2700A / AL-2700B
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