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FEG SEM  Field Emission Gun Scanning Electron Microscope
FEG SEM Field Emission Gun Scanning Electron Microscope
Origin of place China
Model KYKY EM 8100
Supplier KYKY Technology Development Ltd.
Price
Hits 2252
Updated 5/6/2024
  • Product Detail
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1. Working conditions:

Power supply:

1.1 230 v (+ / - 6% and 10%) / 50 hz (+ / - 1%).Requires an UPS uninterrupted power supply.

1.2 running time environment temperature: 17-23 ° C

1.3 running time environment: < 80% relative humidity (no condensation)

1.4 noise: < 68 db 

1.5 The durability of the instrument operation can run continuously

2. Applications:

Mainly applied to the specimen surface appearance analysis. Equipped with energy spectrum which is used for composition analysis and equipped with a small ion sputtering apparatus to help with sample surface treatment. 

3. The Technical Specifications

1) Resolution of Secondary electron image(SE):0.9nm@ 30 Kv; 3nm@1Kv

                   Back Scattered Electron Image(BSE):2.5nm@30Kv

2). The Magnification: 6X-1000,000 x  

3). The Accelerating Voltage:0 ~ 30 Kv(0~10Kv step in 100v,10Kv~30Kv step in 1Kv )

4). Electron Gun:Schottky field emission gun;

Automatic adjustment function: focus, brightness/contrast, astigmatism, dynamic focusing, electron beam on the medium.

 

5). The tube

High-performance lens system

Aperture of the objective lens: they can be adjusted outside the vacuum chamber and the objective aperture can be replaced without removing lens barrel.

 

6). Vacuum system

Adsorbed ion compound pump,sputtering ion pump, turbo molecular pump mechanical pump three-stage vacuum system. Automatic vacuum control, vacuum interlock,sample chamber vacuum is not less than7E-4 Pa,electron gun vacuum is not less than 5E-7Pa

 

7). The Detector

High vacuum secondary electron detector.

adapting multiple accessories and detectors such as EBSD, WDS, EDS, BSE etc.

 

8).Specimen Stage

Specimen Chamber: 6 ports, adapting multiple accessories and detectors such as EBSD, WDS, EDS, BSE etc.

 Specimen Exchange: Draw-out mechanism.(Independent vacuum space)

 Standard Specimen Stage

 

 

 

EM8100F

(X,Y) Automatic

Standard

5 Axis Automatic

(Option)

X

0-80mm

0-150mm

Y

0-80mm

0-150mm

Z

0-60mm

0-60mm

R

360°

360°

T

-5°~90°

-5°~75°

Max Specimen

110mm

150mm

 Scanning method: plane, line, spot, area selected.

 

9). The image processor

Maximum 16384 x 16384 pixel display

Image file formats: BMP,GIF,TIF,TIFF,JPG,MNG,ICO CUR,TGA,PCX,JP2,JPC,PGX,RAS,

PNM,SKA,SEM(.SEM).

Automatic recording digital movie: (avi) function

 

10) The PC and Control (Or Customer Request)

Microsoft® Windows 7 operation system use to manage the SEM software. Image can be saved or printed anytime during the working time.The configuration of PC I5-6500 3.2GHz,3.6GHz Turbo, 6MB HD graphics 530;Memory DDR4 4G;21.5" LED;500G Hard Disk;DELL keyboard and mouse. 

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