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X-ray Diffractometer (x ray diffraction analyzer) (XRD) for powder and other material analysis
X-ray Diffractometer (x ray diffraction analyzer) (XRD) for powder and other material analysis
Origin of place China
Model AL-Y3000
Supplier Dandong Aolong Group
Price
Hits 968
Updated 3/6/2024
  • Product Detail
  • Company Profile

AL Series diffractometer is designed for materials research and industrial products' analysis. It is the perfect combination of conventional analysis with special-purpose measurement products.

● The perfect combination of hardware and software systems meets the needs of academics and researchers in different application areas.

● High precision diffraction angle measurement system obtains more accurate results

● High stability of the X-ray generator control system gets more stable repeatability precision

● Programmable operation, integrated structure design, easy operation, elegant outlook. X-ray diffraction (XRD) is a versatile test instrument to reveal the crystal structure and chemical information:

● Unknown samples in a variety of phase identification

● Mixed samples with known quantitative phase analysis

● Crystal structure analysis

● Crystal structure changes under Unconventional conditions (high temperature, low temperature conditions)

● Analysis on material surface film

● Analysis on metal material texture and stress

AL-Y3000

Rated power

3kW、4kw

Tube voltage

10-60kV

Tube current

5-80mA

X-ray tube

glass tube with 1*10mm focus size;

ceramic tube with 0.4*14mm focus size;

ripple ceramic tube with 2*12mm focus size.

Target material can be Cu, Fe, Co, Cr, Mo etc according to user’s testing needs

Rated Power 2kW

Focus size

1*10mm or 0.4*14mm or 2*12mm, customized by user

Stability

≤0.01%

Goniometer structure

Horizontal ( θ-2θ )

Radius of diffraction

185mm

Scanning range

0-164

Scanning speed

0.0012°-70°min

Max.revolving speed

100°/min

Scanning fashion

θ-2θ linkage, θ, 2θ single action; continuous or stepping scanning

Angle repeatable accuracy

1/1000°

Minimal stepping angle

1/1000°

Detector

proportional counters(PC) or scintillation counters(SC)

Maximal counting rate of linearity

5*105 CPS (with the compensate function of drop out counting)

Energy resolution ratio

≤25% (PC), ≤50% (SC)

Counting fashion

differential coefficient or integral, PHA automatically, Dead time regulate

Stability of the system measure

≤0.01%

Scattered rays dose

≤1μ Sv/h (without X-ray protective device)

Instrument integrative stability

≤0.5%

Figure size

1100*850*1750mm

Formal WEBSITE LINK

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