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Scanning Electron Microscope(SEM)
Scanning Electron Microscope(SEM)
Origin of place China
Model KYKY-2800B
Supplier KYKY Technology Development Ltd.
Price $ 62000
Hits 10138
Updated 1/8/2018
  • Product Detail
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Product Information
Type: KYKY-2800B

Target: High resolution: 4.5 nm (tungsten gun).
Magnification ranges from 15x to 250,000x
Accelerating voltage ranges from 0 to 30 KV.
Complete SEM operation and control system based on PC.
Multiple microprocessor control.
Automatic brightness and contrast adjustment, automatic focus and stigmata.
General and special image processing and analysis.
Windows operation interface, multifunction menu operational with mouse.
Six interfaces connecting accessories such as back-reflection beam probe and X-ray energetic spectrum analyzer probe.
Editing and printing of Chinese and English report with images and graphs

Sales: Tel:0086-010-62571593
Fax:0086-010-62564613
Website:www.kyky.com.cn
Post Code:100080
E-mail:kx-sem@kyky.com.cn
Add:Zhongguancun Beijing,China
P.O.Box: Scientific Instrument Division,No.2724 Beijing,China

Explain: KYKY-2800B SEM is a high-performance product developed by KYKY on the basis of its research and manufacturing experiences in the past decades and introduction of latest computer and image technologies.

In addition to the excellent process, stability and reliability of original KYKY SEMs, the instrument is added with various computerized automatic control and adjustment functions. With the resolution rate of image increased to 4.5 nm, the application fields of the instrument has been significantly expanded. Die to adoption of high-resolution image and graph processor and memory stack, the digital acquisition and display of image can reach 1024 x 1024. As a result, the image quality has been tremendously improved. Pentium CPU, user friendly Windows image interface operating system with vivid symbols and buttons may facilitate customers to fulfill all kinds of complicated image processing or analysis and easily obtain the data of all tests and analysis and contents of the technical reports. The instrument was awarded BCEIA gold medal of the 6th International Analysis Instrument Exposition.

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