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AELAB X-ray Diffractometer AL-2700A/AL-2700B
AELAB X-ray Diffractometer AL-2700A/AL-2700B
Origin of place China
Model AL-2700A、AL-2700B
Supplier AELAB Guangzhou
Price
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Updated 12/10/2025
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AELAB X-ray Diffractometer AL-2700A / AL-2700B
Advanced XRD System for Precise Material Structure Analysis. The AL-2700 series offers comprehensive analysis of crystalline materials, suitable for metals, ceramics, composites, nanomaterials, and thin films. Featuring high-precision goniometer design, advanced detector options, and powerful software control, it delivers superior stability and accuracy across research and industrial applications.

Engineered for versatility, the AL-2700A and AL-2700B support powders, bulk samples, and micro-samples, ensuring dependable results in materials science, environmental testing, cement, pharmaceutical, and polymer industries.

Category Insight: X-ray diffractometers (XRD) are essential for phase identification, crystallinity analysis, and structural characterization in materials research and industrial quality control.

🔗 Explore related category

Technical Features and Specifications
Specification AL-2700A AL-2700B
Rated Power 3 kW (High-frequency HV control) 4 kW
Tube Voltage 10–60 kV
Tube Current 5–50 mA 5–80 mA
X-ray Tube Metal-ceramic, Target: Cu/Fe/Co/Cr/Mo; Power: 2.4 kW
Focus Size 1×10 mm, 0.4×14 mm, or 2×12 mm
Stability ≤0.005% ≤0.01%
Goniometer Structure Sample level (θ–θ) geometry
Radius of Diffraction 225 mm (custom 150–285 mm)
2θ Scanning Range 0–160°
Scanning Speed 0.0012°–50°/min
Angle Repeat Accuracy 1/10000°
Detector Options Proportional Counter, Scintillation Counter, Silicon Drift Detector (SDD), 1D Semiconductor Array
Energy Resolution ≤25% (PC), 550 eV (SC), 520 eV (SDD)
System Stability ≤0.01%
Radiation Dose ≤1 µSv/h (without protective device)
Instrument Stability ≤0.1% ≤0.5%
Dimensions (L×W×H) 1000 × 800 × 1600 mm

💡 Key Advantages
  • Supports wide range of sample types – powders, thin films, and micro-samples
  • High angular precision (±0.0001°) for superior crystal structure analysis
  • Stable high-frequency power supply ensuring long-term measurement reliability
  • Selectable detectors for flexibility between speed and resolution
  • Meets international standards (SRM1976b angular linearity ≤0.022°)
  • Compact 1.6 m frame ideal for laboratory and industrial integration

Applications: Crystallographic analysis of metals, alloys, polymers, semiconductors, pharmaceuticals, cement, clays, and nanomaterials. Widely used in materials science, chemical industry, environmental monitoring, and academic research.


FAQ

Q: What is the difference between AL-2700A and AL-2700B?

A: The AL-2700B offers higher rated power (4 kW) and extended tube current range (up to 80 mA) for more demanding analytical applications.

Q: What detectors are available?

A: Multiple detector options are supported, including Proportional Counter, Scintillation Counter, and Silicon Drift Detector (SDD) for flexible resolution and speed.

Q: Can the goniometer radius be customized?

A: Yes, users can request custom diffraction radii between 150–285 mm to suit specific sample types or resolution requirements.

Learn more: Visit AELAB X-ray Diffractometer AL-2700A / AL-2700B


📞 Contact AELAB

Get Expert Advice or Order Now ☎️

🌐 Website: www.aelabgroup.com
📧 Email: info@aelabgroup.com
📱 WhatsApp / WeChat: +86 15800016110

🔎 Need help selecting the right XRD system? Our experts can assist with configuration and application guidance.

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